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Volumn 2, Issue 7, 2005, Pages 2585-2588

Hot-electron microwave noise and power dissipation in AlGaN/AlN/GaN channels for HEMTs

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM NITRIDE; ELECTRON GAS; HIGH ELECTRON MOBILITY TRANSISTORS; PHONONS; SPURIOUS SIGNAL NOISE; THERMAL EFFECTS;

EID: 27344459623     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200461374     Document Type: Conference Paper
Times cited : (24)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.