Temperature-dependent microwave noise performances of AlGaN/GaN HEMTs with post-gate annealing

Physica Status Solidi C: Conferences

Volumn 2, Issue 7, 2005, Pages 2659-2662

  Liu, Dongmin ^a   Lee, Jaesun ^a   Lu, Wu ^a  

^a Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRON MOBILITY; LEAKAGE CURRENTS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS; TRANSISTORS;

CUT-OFF FREQUENCY (FT); MICROWAVE NOISE PERFORMANCES; POST-GATE-ANNEALING (PGA); TEMPERATURE DEPENDENCE;

MICROWAVES;

EID: 27344456450     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200461510     Document Type: Conference Paper

References (13)

1. Y.-F. Wu, A. Saxler, M. Moore, R. P. Smith, S. Sheppard, P. M. Chavarkar, T. Wisleder, U. K. Mishra, and P. Parikh, IEEE Electron Device Lett. 25, 117 (2004).
2. I. Smorchkova, M. Wojtowicz, R. Sandhu, R. Tsai, M. Barsky, C. Namba, P.-S. Liu, R. Dia, et al., IEEE Trans. Microwave Theory Tech. 51, 665 (2003).
3. A. T. Ping, E. Finer, J. Redwing, M. A. Khan, and I. Adesida, Electronics Letters 36, 175 (2000).
4. N. Nguyen, M. Micovic, W. Wong, P. Hashimoto, P. Janke, D. Harvey, and C. Nguyen, Electronics Letters 36, 469 (2000).
5. W. Lu, J. Yang, M. A. Khan, and I. Adesida, IEEE Trans. Electron Devices 48, 581 (2001).
6. W. Lu, V. Kumar, R. Schwindt, E. Finer, and I. Adesida, IEEE Trans. Microwave Theory Tech. 50, 2499 (2002).
7. W. Lu, V. Kumar, E. Finer, and I. Adesida, IEEE Trans. Electron Devices 50, 1069 (2003).
8. I. Daumiller, C. Kirchner, Kamp, K. Ebeling, L. Pond, C. Weitzel, and E. Kohn, Device Res. Conf. Dig., 114 (1998).
9. Y.-F. Wu, B. Keller, S. Keller, D. Kapolnek, P. Kozodoy, S. Denbaars, and U. Mishra, Solid State Electronics 41, 1569 (1997).
10. J. Lee and K. Webb, IEEE Trans. Microwave Theory Tech. 52, 2 (2004).
11. I. Adesida, W. Lu, and V. Kumar, Proceedings of 6th International Conference on Solid-State and Integrated-Circuit Technology, 1163 (2001).
12. Z. Lin, H. Kim, J. Lee, and W. Lu, Appl. Phys. Lett. 84, 1585 (2004).
13. J. Lee, D. Liu, and W. Lu, Solid State Electronics, Solid State Electronics 48, 1855 (2004).