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Volumn 60, Issue , 2004, Pages 101-110

Possibilities and limitations of voltage-modulated scanning force microscopy: Resonances in contact mode

Author keywords

Contact resonance; Electrostatic interaction; Ferroelectric domains; Piezoresponse; Polarization switching and hysteresis; Scanning force microscopy

Indexed keywords

ELECTRIC POTENTIAL; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; PIEZOELECTRICITY;

CONTACT RESONANCE; ELECTROSTATIC INTERACTION; FERROELECTRIC DOMAINS; PIEZORESPONSE; POLARIZATION SWITCHING;

FERROELECTRIC THIN FILMS;

EID: 27244437166 PISSN: 10584587 EISSN: 16078489 Source Type: Conference Proceeding
DOI: 10.1080/10584580490441719 Document Type: Article

Times cited : (8)

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