Detection mechanism of spontaneous polarization in ferroelectric thin films using electrostatic force microscopy

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 38, Issue 3 A, 1999, Pages

  Lee, Kyongmi ^a   Shin, Hyunjung ^a   Moon, Won Kyu ^a   Jeon, Jong Up ^a   Pak, Y Eugene ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; ELECTROSTATICS; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; MICROSCOPIC EXAMINATION; POLARIZATION; THIN FILMS;

ELECTROMECHANICAL VIBRATIONS; ELECTROSTATIC FORCE MICROSCOPY (EFM); LEAD ZIRCONATE TITANATE; SPONTANEOUS POLARIZATION;

DIELECTRIC FILMS;

EID: 0032627193     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.l264     Document Type: Article

References (16)