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Volumn 552, Issue 1-2, 2005, Pages 49-55
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Characterization of oxygen dimer-enriched silicon detectors
c
CERN
(Switzerland)
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Author keywords
Electron irradiation; FTIR; Oxygen dimer; Proton irradiation; Radiation hardness; Silicon detector
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Indexed keywords
CONCENTRATION (PROCESS);
DETECTORS;
DIMERS;
DIODES;
ELECTRON IRRADIATION;
ELECTRONS;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
PROTON IRRADIATION;
TEMPERATURE DISTRIBUTION;
OXYGEN DIMERS;
RADIATION HARDNESS;
SILICON DETECTORS;
SILICON SENSORS;
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EID: 26444503139
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2005.06.005 Document Type: Conference Paper |
Times cited : (5)
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References (17)
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