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Volumn 552, Issue 1-2, 2005, Pages 49-55

Characterization of oxygen dimer-enriched silicon detectors

Author keywords

Electron irradiation; FTIR; Oxygen dimer; Proton irradiation; Radiation hardness; Silicon detector

Indexed keywords

CONCENTRATION (PROCESS); DETECTORS; DIMERS; DIODES; ELECTRON IRRADIATION; ELECTRONS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PROTON IRRADIATION; TEMPERATURE DISTRIBUTION;

EID: 26444503139     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.06.005     Document Type: Conference Paper
Times cited : (5)

References (17)
  • 6
    • 26444544469 scopus 로고    scopus 로고
    • CERN-LHCC-2003-058 and literature cited therein
    • RD50 Status Report 2002/2003; CERN-LHCC-2003-058 and literature cited therein.
    • RD50 Status Report , vol.2002 , Issue.2003


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.