Evaluation of memory built-in self repair techniques for high defect density technologies

Proceedings - IEEE Pacific Rim International Symposium on Dependable Computing

Volumn , Issue , 2004, Pages 315-320

  Anghel, Lorena ^a   Achouri, Nadir ^b   Nicolaidis, Michael ^b  

^a TIMA LABORATORY   (France)

^b iRoC Technologies   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT IN SELF REPAIR (BISR); BUILT IN SELF TESTS (BIST); EMBEDDED MEMORIES;

CMOS INTEGRATED CIRCUITS; COMPUTER ARCHITECTURE; COMPUTER HARDWARE; COSTS; EMBEDDED SYSTEMS; LASER BEAMS; MICROPROCESSOR CHIPS; REPAIR;

DATA STORAGE EQUIPMENT;

EID: 2642559540     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PRDC.2004.1276581     Document Type: Conference Paper

References (13)

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