A BISR (built-in self-repair) circuit for embedded memory with multiple redundancies

ICVC 1999 - 6th International Conference on VLSI and CAD

Volumn , Issue , 1999, Pages 602-605

  Kim, Heon Cheol ^a   Yi, Dong Soon ^a   Park, Jin Young ^a   Cho, Chang Hyun ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84964929905     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICVC.1999.821012     Document Type: Conference Paper

References (3)

1. D. Bhavsar and J. Edmondson, "Testability Strategy of the Alpha 21 164 Microprocessor," in Proc. of Inc. Test Conf, pp. 50-59, 1994.
2. I. Kim, Y. Zorian, G. Komoriya, and H. Pham, "Built in self repair for embedded high density SRAM," in Proc. of Int. Test Conf, pp. 1112-1119, 1998.
3. S. Kuo and W. K. Fuchs, "Efficient Spare Allocation in Reconfigurable Arrays," DAC, pp. 385-390, 1986