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Volumn , Issue , 1998, Pages 1112-1119
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Built in self repair for embedded high density SRAM
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
BUILT-IN SELF TEST;
EMBEDDED SYSTEMS;
RANDOM ACCESS STORAGE;
EMBEDDED HIGH DENSITY MEMORIES;
INTEGRATED CIRCUIT TESTING;
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EID: 0032308289
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (174)
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References (11)
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