Built in self repair for embedded high density SRAM

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 1112-1119

  Kim, Ilyoung ^a   Zorian, Yervant ^a   Komoriya, Goh ^a   Pham, Hai ^a   Higgins, Frank P ^a   Lewandowski, Jim L ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BUILT-IN SELF TEST; EMBEDDED SYSTEMS; RANDOM ACCESS STORAGE;

EMBEDDED HIGH DENSITY MEMORIES;

INTEGRATED CIRCUIT TESTING;

EID: 0032308289     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)