A family of self-repair SRAM cores

Proceedings - 6th IEEE International On-Line Testing Workshop

Volumn , Issue , 2000, Pages 214-218

  Benso, A ^a   Chiusano, S ^a   Di Natale, G ^a   Prinetto, P ^a   Bodoni, M L ^b  

^a POLITECNICO DI TORINO   (Italy)

^b Siemens Information and Communication Networks SpA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

REPAIR;

FAULTY CELLS; PHYSICAL LAYOUT; SELF REPAIR; TEST SOLUTIONS; USER INTERVENTION;

STATIC RANDOM ACCESS STORAGE;

EID: 84960439799     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/OLT.2000.856639     Document Type: Conference Paper

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