Built-in self-repair circuit for high-density ASMIC

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1989, Pages

  Sawada, Kazuhiro ^a   Sakurai, Takayasu ^a   Uchino, Yukinori ^a   Yamada, Kaoruko ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, SEMICONDUCTOR; INTEGRATED CIRCUITS; LOGIC DEVICES--GATES;

APPLICATION-SPECIFIC MEMORY IC; BUILT-IN SELF-REPAIR (BISR) CIRCUIT; SELF-REPAIR CIRCUIT;

DATA STORAGE, DIGITAL;

EID: 0024662435     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)