Optimal reconfiguration functions for column or data-bit built-in self-repair

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2003, Pages 590-595

  Nicolaidis, M ^a   Achouri, N ^a   Boutobza, S ^a  

^a iRoC Technologies   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE DEVICES; BUILT-IN SELF-REPAIR; CIRCUIT YIELD; EMBEDDED MEMORY; LOW HARDWARE COSTS; MULTIPLE FAULTS; OPTIMAL RECONFIGURATIONS; REPAIR SCHEMES;

EXHIBITIONS; OPTIMIZATION;

REPAIR;

EID: 13244263774     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2003.1253672     Document Type: Conference Paper

References (10)

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9. M. Nicolaidis, ?Dispositif de reconfiguration d?un ensemble mémoire présentant des défauts? French patent, no 2 820 844
10. M. Nicolaidis, ?Reconfiguration device for a faulty memory? US patent pending