A memory Built-In Self-Repair for high defect densities based on error polarities

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn 2003-January, Issue , 2003, Pages 459-466

  Nicolaidis, M ^a   Achouri, N ^a   Anghel, L ^b  

^a IROC Technologies   (France)

^b TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ERRORS; FAULT TOLERANCE; REPAIR;

BUILT IN SELF REPAIRS; CURRENT TECHNOLOGY; HIGH DEFECT DENSITIES; NEW APPROACHES; ORDERS OF MAGNITUDE; REPAIR SCHEMES;

DEFECT DENSITY;

EID: 84964931431     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TSM.2005.1250144     Document Type: Conference Paper

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