Structural transformations in self-assembled semiconductor quantum dots as inferred by transmission electron microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4807, Issue , 2002, Pages 71-82

  Möck, Peter ^a   Lei, Yuanyuan ^a   Topuria, Teya ^a   Browning, Nigel D ^a   Ragan, Regina ^b,c   Min, Kyu S ^b,d   Atwater, Harry A ^b  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^b California Institute of Technology   (United States)

^c HEWLETT PACKARD LABORATORIES   (United States)

^d INTEL CORPORATION   (United States)

Author keywords

Atomic ordering; Nanoscience; Phase separation; Phase transformation; Semiconductor quantum dots

Indexed keywords

ELECTRON ENERGY LEVELS; MOLECULAR BEAM EPITAXY; PHASE SEPARATION; PHASE TRANSITIONS; SELF ASSEMBLY; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR GROWTH; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC ARRANGEMENTS; ATOMIC ORDER; ATOMIC ORDERING; LATTICE MISMATCH; NANOSCIENCE; STRUCTURAL TRANSFORMATIONS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0036980603     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.450998     Document Type: Conference Paper

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