Antenna-based near-field scanning optical microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5766, Issue , 2005, Pages 126-133

  Hamann, Hendrik F ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Apertureless NSOM; Atomic force microscopy; Microscopy; Nanocyrstals; Near field optics; Scattering

Indexed keywords

APERTURELESS NSOM; DIPOLES; NEAR FIELD OPTICS; SPATIAL RESOLUTION;

ANTENNAS; ATOMIC FORCE MICROSCOPY; NANOSTRUCTURED MATERIALS; POLARIZATION; SCANNING; SCATTERING;

MICROSCOPIC EXAMINATION;

EID: 25644456646     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.607421     Document Type: Conference Paper

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