Extinction near-field optical microscopy

Optics Communications

Volumn 227, Issue 1-3, 2003, Pages 1-13

  Hamann, H F ^a,b   Larbadi, M ^a,c   Barzen, S ^a   Brown, T ^a   Gallagher, A ^a,d   Nesbitt, D J ^a,d  

^a UNIVERSITY OF COLORADO   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c Inst Naz per la Fiscia della Mat   (Italy)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROSTATICS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SHOT NOISE;

LIGHT INTENSITY;

OPTICAL COMMUNICATION;

EID: 0142061197     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2003.08.039     Document Type: Article

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