Exploring the fundamental effects of miniaturisation on ferroelectrics by focused ion beam processing of single crystal material

Journal De Physique. IV : JP

Volumn 128, Issue , 2005, Pages 63-70

  Saad, M M ^a   Baxter, P ^a   Schilling, A ^a   Adams, T ^a   Zhu, X ^a   Bowman, R M ^a   Gregg, J M ^a   Zubko, P ^b   Morrison, F D ^b   Scott, J F ^b  

^a QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; DIELECTRIC MATERIALS; HETEROJUNCTIONS; ION BEAMS; MICROSCOPES; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

DEFECT CHEMISTRY VARIATION; DIMENSIONAL ARCHITECTURES; ION BEAM MICROSCOPE; MINIATURISATION;

FERROELECTRIC MATERIALS;

EID: 25644449592     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:2005128010     Document Type: Conference Paper

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