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PIERS spectra were recorded on a Thermo Nicolet Nexus Fourier transform infrared spectrometer in a SAGA™ mode. An ellipsometer (Gaertner L116s) equipped with a He-Ne laser (632.8 nm) was used to determine the thickness of the films. Contact angles were determined using a Phoenix 300 apparatus (SEO, Ltd., Korea). The XPS study was performed with a VG-Scientific ESCA-LAB 250 spectrometer with a monochromatized Al Kα X-ray source.
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