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Volumn 283, Issue 3-4, 2005, Pages 315-319
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Effects of mean free path on the preferentially orientated growth of AlN thin films
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Author keywords
A1. Orientation; A1. X ray diffraction; A3. Sputtering; B1. Aluminum nitride film
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Indexed keywords
CRYSTAL GROWTH;
CRYSTAL ORIENTATION;
MAGNETRON SPUTTERING;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
ALUMINUM NITRIDE FILMS;
MAGNETIC SPUTTERING METHODS;
ORIENTATION;
RADIO FREQUENCY (RF);
ALUMINUM NITRIDE;
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EID: 24644511151
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2005.06.007 Document Type: Article |
Times cited : (22)
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References (13)
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