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Volumn 283, Issue 3-4, 2005, Pages 315-319

Effects of mean free path on the preferentially orientated growth of AlN thin films

Author keywords

A1. Orientation; A1. X ray diffraction; A3. Sputtering; B1. Aluminum nitride film

Indexed keywords

CRYSTAL GROWTH; CRYSTAL ORIENTATION; MAGNETRON SPUTTERING; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 24644511151     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.06.007     Document Type: Article
Times cited : (22)

References (13)
  • 10
    • 17944372156 scopus 로고    scopus 로고
    • National Defense Industry Press Beijing
    • Daoan Da Vacuum Design Handbook 1996 National Defense Industry Press Beijing p. 36 in Chinese
    • (1996) Vacuum Design Handbook
    • Da, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.