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Volumn 121, Issue 3, 1999, Pages 196-201

Three-dimensional versus two-dimensional finite element modeling of flip-chip packages

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0345761131     PISSN: 10437398     EISSN: 15289044     Source Type: Journal    
DOI: 10.1115/1.2792684     Document Type: Article
Times cited : (50)

References (13)
  • 2
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    • Miscellaneous Modeling Issues in Thermomechanical Stress Analysis of Surface-Mount Interconnects
    • Suhir et al., eds., ASME, New York
    • Dasgupta, A„ et al., 1997, “Miscellaneous Modeling Issues in Thermomechanical Stress Analysis of Surface-Mount Interconnects,” INTERPACK 97, Proc., EEP-Vol. 19-2, Suhir et al., eds., ASME, New York, pp. 1095-1100.
    • (1997) INTERPACK 97 , vol.19-2 , pp. 1095-1100
    • Dasgupta, A.1
  • 3
    • 0031334644 scopus 로고    scopus 로고
    • Electo-Thermo-Mechanical Responses of Conductive Adhesive Systems
    • Hu, K. X., et al., 1997, “Electo-Thermo-Mechanical Responses of Conductive Adhesive Systems,” IEEE CPMT-A, Vol. 20, pp. 470-477.
    • (1997) IEEE CPMT-A , vol.20 , pp. 470-477
    • Hu, K.X.1
  • 4
    • 0030165623 scopus 로고    scopus 로고
    • Solder Joint Reliability Prediction by the Integrated Matrix Creep Method
    • Iannuzzelli, R. J., et al., 1996, “Solder Joint Reliability Prediction by the Integrated Matrix Creep Method,” ASME Journal of Electronic Packaging, Vol. 118, pp. 55-61.
    • (1996) ASME Journal of Electronic Packaging , vol.118 , pp. 55-61
    • Iannuzzelli, R.J.1
  • 5
    • 0030871137 scopus 로고    scopus 로고
    • A Mechanistic Model for Fatigue Life Prediction of Solder Joints for Electronic Packages
    • Lee, S. B. and Kim, J. K., 1997, “A Mechanistic Model for Fatigue Life Prediction of Solder Joints for Electronic Packages,” Int. J. Fatigue, Vol. 19, No. 1, pp. 85-91.
    • (1997) Int. J. Fatigue , vol.19 , Issue.1 , pp. 85-91
    • Lee, S.B.1    Kim, J.K.2
  • 9
    • 0030714913 scopus 로고    scopus 로고
    • Stresses From Flip-Chip Assembly and Underfill; Measurements with the ATC4.1 Assembly Test Chip and Analysis by Finite Element Method
    • San Jose, CA
    • Peterson, D. W., et al., 1997, “Stresses From Flip-Chip Assembly and Underfill; Measurements with the ATC4.1 Assembly Test Chip and Analysis by Finite Element Method,” Proceedings, 47th Electronic Components and Technology Conference, San Jose, CA, pp. 134-143.
    • (1997) Proceedings, 47Th Electronic Components and Technology Conference , pp. 134-143
    • Peterson, D.W.1
  • 10
    • 0027553160 scopus 로고
    • Effects of Slightly Weakened Interfaces on the Overall Elastic Properties of Composite Materials
    • Qu, J., 1993, “Effects of Slightly Weakened Interfaces on the Overall Elastic Properties of Composite Materials,” Mechanics of Materials, Vol. 14, pp. 269-281.
    • (1993) Mechanics of Materials , vol.14 , pp. 269-281
    • Qu, J.1
  • 11
    • 0030685985 scopus 로고    scopus 로고
    • Materials Mechanics and Mechanical Reliability of Flip Chip Assemblies on Organic Substrates
    • Schubert, A., et al., 1997, “Materials Mechanics and Mechanical Reliability of Flip Chip Assemblies on Organic Substrates,” Proceedings, International Symposium on Advanced Packaging Materials, pp. 106-109.
    • (1997) Proceedings, International Symposium on Advanced Packaging Materials , pp. 106-109
    • Schubert, A.1
  • 13
    • 0345805736 scopus 로고    scopus 로고
    • Flip Chip Off the Dime?
    • March/April
    • Wesselmann, C., 1996, “Flip Chip Off the Dime?,” Advanced Packaging, March/April, pp. 7.
    • (1996) Advanced Packaging , vol.7
    • Wesselmann, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.