Design of reconfigurable access wrappers for embedded core based SOC test

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2002-January, Issue , 2002, Pages 106-111

  Koranne, S ^a  

^a Tanner Research Inc   (United States)

Author keywords

Delay; Design engineering; Design for testability; Firewire; Knowledge transfer; Power capacitors; Productivity; System testing; System on a chip; Very large scale integration

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; DATA COMPRESSION; DESIGN; DESIGN FOR TESTABILITY; DYNAMIC MODELS; EMBEDDED SYSTEMS; GRAPH THEORY; INTEGRATION TESTING; KNOWLEDGE MANAGEMENT; MICROPROCESSOR CHIPS; PRODUCTIVITY; PROGRAMMABLE LOGIC CONTROLLERS; SYSTEM-ON-CHIP; VLSI CIRCUITS;

DELAY; DESIGN ENGINEERING; FIREWIRES; KNOWLEDGE TRANSFER; POWER CAPACITOR; SYSTEM ON A CHIP; SYSTEM TESTING;

INTEGRATED CIRCUIT DESIGN;

EID: 2442523412     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2002.996707     Document Type: Conference Paper

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