Lifetime prediction on the base of mission profiles

Microelectronics Reliability

Volumn 45, Issue 9-11, 2005, Pages 1293-1298

  Ciappa, Mauro ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; LARGE SCALE SYSTEMS; PROBLEM SOLVING; RELIABILITY; STRESSES;

COMPLEX DEVICES; LIFETIME PREDICTION; PHYSICAL MODELING;

MICROELECTRONICS;

EID: 24144456234     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2005.07.060     Document Type: Conference Paper

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