Electromagnetic radiation effect on sapphire charge trapping properties

Proceedings of the International Conference on Electric Charge in Solid Insulators, CSC

Volumn , Issue , 1998, Pages 527-530

  Vallayer, J ^a   Treheux, D ^a  

^a ECOLE CENTRALE DE LYON   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; RADIATION EFFECTS; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; ULTRAVIOLET RADIATION;

CHARGE TRAPPING; SCANNING ELECTRON MICROSCOPE MIRROR (SEMM) EFFECT;

DIELECTRIC MATERIALS;

EID: 0031630975     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)