Charging at the steady state in EPMA, SEM and ESEM

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 426-427

  Cazaux, J ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036409170     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s143192760210095x     Document Type: Conference Paper

References (5)

1. J. Cazaux, X-Ray Spectrometry 25 (1996) 265
2. O. Jbara et al, X-Ray Spectrometry 26 (1997) 291
3. J. Cazaux, Microscopy & Microanalysis, Special Issue: "Characterization of non-conductive"
4. J. Cazaux, Eur. Phys.; J.A.P. 15 (2001) 167
5. B.J. Griffin, Scanning 22 (2001)234