메뉴 건너뛰기




Volumn 81, Issue 5, 2005, Pages 997-1000

Characterization of 90° domain structure and polarization switching in Pb(Zr0.4Ti0.6)O3 film by piezoresponse force microscope

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEPOSITION; ELECTRIC FIELD EFFECTS; FERROELECTRIC MATERIALS; POLARIZATION; SOL-GELS; STRESS ANALYSIS; SWITCHING;

EID: 24044473999     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-004-2977-3     Document Type: Article
Times cited : (9)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.