-
2
-
-
0037972997
-
-
International Reliability Physics Symposium Proceedings
-
A. Kerber, E. Cartier, L. Pantisano, M. Rosmeulen, R. Degraeve, T. Kauerauf, G. Groeseneken, H. E. Maes, and U. Schwalke, International Reliability Physics Symposium Proceedings, 2003, p. 41.
-
(2003)
, pp. 41
-
-
Kerber, A.1
Cartier, E.2
Pantisano, L.3
Rosmeulen, M.4
Degraeve, R.5
Kauerauf, T.6
Groeseneken, G.7
Maes, H.E.8
Schwalke, U.9
-
3
-
-
0036927918
-
-
International Electron Device Meeting, Tech. Digest
-
S. Zafar, A. Callegari, E. Gusev, and M. V. Fishetti, International Electron Device Meeting, Tech. Digest (2002), p. 517.
-
(2002)
, pp. 517
-
-
Zafar, S.1
Callegari, A.2
Gusev, E.3
Fishetti, M.V.4
-
4
-
-
0043201362
-
-
K. Onishi, R. Choi, C. S. Kang, H.-J. Cho, Y. H. Kim, R. E. Nieh, J. Han, S. A. Krishnan, M. S. Akbar, and J. C. Lee, IEEE Trans. Electron Devices 50, 1517 (2003).
-
(2003)
IEEE Trans. Electron Devices
, vol.50
, pp. 1517
-
-
Onishi, K.1
Choi, R.2
Kang, C.S.3
Cho, H.-J.4
Kim, Y.H.5
Nieh, R.E.6
Han, J.7
Krishnan, S.A.8
Akbar, M.S.9
Lee, J.C.10
-
5
-
-
17644422666
-
-
International Electron Device Meeting, Tech. Digest
-
H. Takeuchi, H. Y. Wong, D. W. Ha, and T. J. King, International Electron Device Meeting, Tech. Digest (2004), p. 829.
-
(2004)
, pp. 829
-
-
Takeuchi, H.1
Wong, H.Y.2
Ha, D.W.3
King, T.J.4
-
6
-
-
0034825377
-
-
J. Aarik, A. Aidla, H. Mändar, T. Uustare, K. Kukli, and M. Schuisky, Appl. Surf. Sci. 173, 15 (2001).
-
(2001)
Appl. Surf. Sci.
, vol.173
, pp. 15
-
-
Aarik, J.1
Aidla, A.2
Mändar, H.3
Uustare, T.4
Kukli, K.5
Schuisky, M.6
-
7
-
-
11944256577
-
-
M. C. Payne, M. P. Teter, D. C. Allen, T. A. Arias, and J. D. Joannopoulos, Rev. Mod. Phys. 64, 1045 (1992).
-
(1992)
Rev. Mod. Phys.
, vol.64
, pp. 1045
-
-
Payne, M.C.1
Teter, M.P.2
Allen, D.C.3
Arias, T.A.4
Joannopoulos, J.D.5
-
8
-
-
0028763270
-
-
0953-8984 10.1088/0953-8984/6/40/015
-
G. Kresse and J. Hafner, J. Phys.: Condens. Matter 0953-8984 10.1088/0953-8984/6/40/015 6, 8245 (1994); G. Kresse and J. Furthmüller, Comput. Mater. Sci. 0927-0256 10.1016/0927-0256(96)00008-0 6, 15 (1996); G. Kresse and J. Furthmüller, Phys. Rev. B 54, 11169 (1996).
-
(1994)
J. Phys.: Condens. Matter
, vol.6
, pp. 8245
-
-
Kresse, G.1
Hafner, J.2
-
9
-
-
0030190741
-
-
0927-0256 10.1016/0927-0256(96)00008-0
-
G. Kresse and J. Hafner, J. Phys.: Condens. Matter 0953-8984 10.1088/0953-8984/6/40/015 6, 8245 (1994); G. Kresse and J. Furthmüller, Comput. Mater. Sci. 0927-0256 10.1016/0927-0256(96)00008-0 6, 15 (1996); G. Kresse and J. Furthmüller, Phys. Rev. B 54, 11169 (1996).
-
(1996)
Comput. Mater. Sci.
, vol.6
, pp. 15
-
-
Kresse, G.1
Furthmüller, J.2
-
10
-
-
2442537377
-
-
G. Kresse and J. Hafner, J. Phys.: Condens. Matter 0953-8984 10.1088/0953-8984/6/40/015 6, 8245 (1994); G. Kresse and J. Furthmüller, Comput. Mater. Sci. 0927-0256 10.1016/0927-0256(96)00008-0 6, 15 (1996); G. Kresse and J. Furthmüller, Phys. Rev. B 54, 11169 (1996).
-
(1996)
Phys. Rev. B
, vol.54
, pp. 11169
-
-
Kresse, G.1
Furthmüller, J.2
-
13
-
-
0036573608
-
-
A. S. Foster, F. L. Gejo, A. L. Shluger, and R. M. Nieminen, Phys. Rev. B 65, 174117 (2002).
-
(2002)
Phys. Rev. B
, vol.65
, pp. 174117
-
-
Foster, A.S.1
Gejo, F.L.2
Shluger, A.L.3
Nieminen, R.M.4
-
14
-
-
0001307437
-
-
R. H. French, S. J. Glass, F. S. Ohuchi, Y.-N. Xu, and W. Y. Ching, Phys. Rev. B 49, 5133 (1994).
-
(1994)
Phys. Rev. B
, vol.49
, pp. 5133
-
-
French, R.H.1
Glass, S.J.2
Ohuchi, F.S.3
Xu, Y.-N.4
Ching, W.Y.5
-
15
-
-
33645432937
-
-
A. T. L. Lim, Honors Project Report, National University of Singapore (2002).
-
(2002)
-
-
Lim, A.T.L.1
-
16
-
-
0038172513
-
-
C. G. Van de Walle and J. Neugebauer, Nature (London) 423, 626 (2003). In this paper, the formation energy of interstitial hydrogen is defined relative to a H2 molecule. A similar definition is used in the present study but the formation energy of the oxygen vacancy is defined relative an isolated O atom, as in Ref..
-
(2003)
Nature (London)
, vol.423
, pp. 626
-
-
Van De Walle, C.G.1
Neugebauer, J.2
-
17
-
-
0036930467
-
-
International Electron Device Meeting, Tech. Digest
-
Y. T. Hou, M. F. Li, H. Y. Yu, Y. Jin, and D.-L. Kwong, International Electron Device Meeting, Tech. Digest (2002), p. 731.
-
(2002)
, pp. 731
-
-
Hou, Y.T.1
Li, M.F.2
Yu, H.Y.3
Jin, Y.4
Kwong, D.-L.5
-
18
-
-
35949040712
-
-
P. W. Anderson, Phys. Rev. Lett. 34, 953 (1975); International Reliability Physics Symposium Proceedings, 2004, p. 269.
-
(1975)
Phys. Rev. Lett.
, vol.34
, pp. 953
-
-
Anderson, P.W.1
-
19
-
-
35949040712
-
-
International Reliability Physics Symposium Proceedings
-
P. W. Anderson, Phys. Rev. Lett. 34, 953 (1975); International Reliability Physics Symposium Proceedings, 2004, p. 269.
-
(2004)
, pp. 269
-
-
-
25
-
-
50549089281
-
-
International Reliability Physics Symposium Proceedings
-
C. Shen, H. Y. Yu, X. P. Wang, M. F. Li, Y.-C. Yeo, D. S. H. Chan, K. L. Bera, and D. L. Kwong, International Reliability Physics Symposium Proceedings, 2004, p. 601.
-
(2004)
, pp. 601
-
-
Shen, C.1
Yu, H.Y.2
Wang, X.P.3
Li, M.F.4
Yeo, Y.-C.5
Chan, D.S.H.6
Bera, K.L.7
Kwong, D.L.8
-
26
-
-
84903215797
-
-
International Reliability Physics Symposium Proceedings
-
S. J. Rhee, Y. H. Kim, C. Y. Kang, H. J. Cho, R. Cho, C. H. Cho, M. S. Akbar, and J. C. Lee, International Reliability Physics Symposium Proceedings, 2004, p. 269.
-
(2004)
, pp. 269
-
-
Rhee, S.J.1
Kim, Y.H.2
Kang, C.Y.3
Cho, H.J.4
Cho, R.5
Cho, C.H.6
Akbar, M.S.7
Lee, J.C.8
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