Deep level transient spectroscopy depth profile measurements of polycrystalline zinc oxide ceramic

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 35, Issue 9 B, 1996, Pages

  Lee, W I ^a   Young, R L ^a   Chen, W K ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; SPECTROSCOPY; TRANSIENTS; VARISTORS; ZINC OXIDE;

DEPTH PROFILE MEASUREMENT;

CRYSTAL DEFECTS;

EID: 0030233648     PISSN: 00214922     EISSN: None     Source Type: None    
DOI: 10.1143/jjap.35.l1158     Document Type: Article

References (15)