Raman spectroscopic studies of Ni-W oxide thin films

Solid State Ionics

Volumn 140, Issue 1-2, 2001, Pages 135-139

  Lee, Se Hee ^a   Cheong, Hyeonsik M ^a,b   Park, Nam Gyu ^a   Tracy, C Edwin ^a   Mascarenhas, Angelo ^a   Benson, David K ^a   Deb, Satyen K ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b Sogang University   (South Korea)

Author keywords

Nickel; Raman spectroscopy; Tungsten

Indexed keywords

BLEACHING; CRYSTALLOGRAPHY; ELECTROCHEMISTRY; ELECTRON TRANSPORT PROPERTIES; EXTRACTION; LITHIUM; NICKEL COMPOUNDS; OXIDES; RAMAN SPECTROSCOPY; THIN FILMS;

NICKEL TUNGSTEN OXIDE;

CONDUCTIVE FILMS;

BLEACHING;

EID: 0035278421     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-2738(01)00707-X     Document Type: Article

References (15)