Density comparison measurement of silicon by pressure of flotation method

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 2, 2001, Pages 604-607

  Waseda, A ^a   Fujii, K ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Avogadro constant; Density; Pressure of flotation; Silicon crystal

Indexed keywords

CALCULATIONS; CRYSTAL DEFECTS; DENSITOMETERS; FLOTATION; LEAST SQUARES APPROXIMATIONS; MATRIX ALGEBRA; PRESSURE; SILICON; SINGLE CRYSTALS;

AVOGADRO CONSTANT; PRESSURE OF FLOTATION METHOD; SILICON SINGLE CRYSTALS; VIBRATING-TUBE DENSIMETER;

DENSITY MEASUREMENT (SPECIFIC GRAVITY);

EID: 0035306916     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.918202     Document Type: Article

References (6)