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Volumn 41, Issue 13, 2005, Pages 774-775

Stable 20 W/mm AlGaN-GaN MOSHFET

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM NITRIDE; DIELECTRIC MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRODES; ELECTRON GAS; GALLIUM NITRIDE; GATES (TRANSISTOR); LEAKAGE CURRENTS; SCHOTTKY BARRIER DIODES;

EID: 22944485700     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20051203     Document Type: Article
Times cited : (17)

References (11)
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    • 10-W/mm AlGaN-GaN HFET with a field modulating plate
    • Ando, Y., et al.: '10-W/mm AlGaN-GaN HFET with a field modulating plate', IEEE Electron Device Lett., 2003, 24, pp. 289-291
    • (2003) IEEE Electron Device Lett. , vol.24 , pp. 289-291
    • Ando, Y.1
  • 3
    • 0442326799 scopus 로고    scopus 로고
    • Performance of the AlGaN HEMT structure with a gate extension
    • Thompson, R., et al.: 'Performance of the AlGaN HEMT structure with a gate extension', IEEE Trans. Electron Devices, 2004, 51, pp. 292-295
    • (2004) IEEE Trans. Electron Devices , vol.51 , pp. 292-295
    • Thompson, R.1
  • 4
    • 1642359162 scopus 로고    scopus 로고
    • 30-W/mm GaN HEMTs by field plate optimization
    • Wu, Y.-F., et al.: '30-W/mm GaN HEMTs by field plate optimization', IEEE Electron Device Lett., 2004, 25, pp. 117-119
    • (2004) IEEE Electron Device Lett. , vol.25 , pp. 117-119
    • Wu, Y.-F.1
  • 6
    • 4444321699 scopus 로고    scopus 로고
    • 9.4-W/mm power density AlGaN-GaN HEMTs on free-standing GaN substrates
    • Chu, K.K., et al.: '9.4-W/mm power density AlGaN-GaN HEMTs on free-standing GaN substrates', IEEE Electron Device Lett., 2004, 25, pp. 596-598
    • (2004) IEEE Electron Device Lett. , vol.25 , pp. 596-598
    • Chu, K.K.1
  • 7
    • 0034141006 scopus 로고    scopus 로고
    • AlGaN/GaN metal-oxide-semiconductor heterostructure field effect transistor
    • Asif Khan, M., et al.: 'AlGaN/GaN metal-oxide-semiconductor heterostructure field effect transistor', IEEE Electron Device Lett., 2000, 21, pp. 63-65
    • (2000) IEEE Electron Device Lett. , vol.21 , pp. 63-65
    • Asif Khan, M.1
  • 8
    • 0141563623 scopus 로고    scopus 로고
    • 4/AlGaN/GaN-metal-insulator- semiconductor heterostructure field-effect transistors
    • 4/AlGaN/GaN-metal-insulator-semiconductor heterostructure field-effect transistors', IEEE Electron Device Lett., 2003, 24, pp. 541-543
    • (2003) IEEE Electron Device Lett. , vol.24 , pp. 541-543
    • Adivarahan, V.1
  • 9
    • 0037291784 scopus 로고    scopus 로고
    • Insulating gate III-N heterostructure field-effect transistors for high power microwave and switching applications
    • Asif Khan, M., et al.: 'Insulating gate III-N heterostructure field-effect transistors for high power microwave and switching applications', IEEE Trans. Microw. Theory Tech., 2003, 51, pp. 624-633
    • (2003) IEEE Trans. Microw. Theory Tech. , vol.51 , pp. 624-633
    • Asif Khan, M.1
  • 10
    • 79956049694 scopus 로고    scopus 로고
    • Maximum current in nitride-based heterostructure field effect transistors
    • Koudymov, A., et al.: 'Maximum current in nitride-based heterostructure field effect transistors', Appl. Phys. Lett., 2002, 80, pp. 3216-3218
    • (2002) Appl. Phys. Lett. , vol.80 , pp. 3216-3218
    • Koudymov, A.1
  • 11
    • 12244255073 scopus 로고    scopus 로고
    • Transient characteristics of GaN-based heterostructure field-effect transistors
    • Kohn, E., et al.: 'Transient characteristics of GaN-based heterostructure field-effect transistors', IEEE Trans Microw. Theory Tech., 2003, MTT-51, pp. 634-642
    • (2003) IEEE Trans Microw. Theory Tech. , vol.MTT-51 , pp. 634-642
    • Kohn, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.