Scattering properties of ordered mesoporous silica films

Optics Communications

Volumn 252, Issue 4-6, 2005, Pages 344-354

  Cheyssac, P ^a   Klotz, M ^b   Sondergard E ^b   Sterligov, V A ^c  

^a UNIVERSITÉ CÔTE D'AZUR   (France)

^b SAINT GOBAIN RECHERCHE   (France)

^c INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

Materials and process characterization; Optical properties; Rayleigh; Scattering; Thin flims

Indexed keywords

CHARACTERIZATION; ENVIRONMENTAL IMPACT; LIGHT SCATTERING; MESOPOROUS MATERIALS; POROSITY; RAYLEIGH SCATTERING; SILICA;

ANGULAR DISTRIBUTION; MATERIALS AND PROCESS CHARACTERIZATION; MESOPOROUS FILMS; NON-POROUS FILMS;

THIN FILMS;

EID: 22544482990     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2005.04.032     Document Type: Article

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