Electronic and microstructure characterization of strontium-bismuth tantalate (SBT) thin films

Journal of the Korean Physical Society

Volumn 32, Issue 4 SUPPL., 1998, Pages

  Hartmann, A J ^a   Lamb, R N ^a   Scott, J F ^a   Johnston, P N ^b   El Bouanani, M ^b   Chen, C W ^c   Robertson, J ^c  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b RMIT UNIVERSITY   (Australia)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032396464     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)

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3. A. J. Hartmann et al., Integ. Ferroelec. (in press).
4. C. Gutleben, Mat. Res. Soc. Proc. 433, 109 (1996) and private communication.
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6. J. -K. Lee et al., Integ. Ferroelec. (in press).
7. V. Joshi et al., Integ. Ferroelec. 14, 133 (1997).
8. R. Waser, Science and Technology of Electroceramic Thin Films (Kluwer, Dordrecht, 1995), p. 223.
9. S. K. Dey et al., Jpn. J. Appl. Phys. 34, 3134 (1995).