-
7
-
-
0037031456
-
-
Benítez, J. J.; Kopta, S.; Ogletree, D. F.; Salmeron, M. Langmuir 2002, 18, 6096.
-
(2002)
Langmuir
, vol.18
, pp. 6096
-
-
Benítez, J.J.1
Kopta, S.2
Ogletree, D.F.3
Salmeron, M.4
-
8
-
-
0000142801
-
-
Viswanathan, R.; Schwartz, D. K.; Garnaes, J.; Zasadzinski, J. A. N. Langmuir 1992, 8, 1603.
-
(1992)
Langmuir
, vol.8
, pp. 1603
-
-
Viswanathan, R.1
Schwartz, D.K.2
Garnaes, J.3
Zasadzinski, J.A.N.4
-
9
-
-
0035838782
-
-
Kitaev, V.; Seo, M.; McGovern, M. E.; Huang, Y.; Kumacheva, E. Langmuir 2001, 17, 4274.
-
(2001)
Langmuir
, vol.17
, pp. 4274
-
-
Kitaev, V.1
Seo, M.2
McGovern, M.E.3
Huang, Y.4
Kumacheva, E.5
-
11
-
-
0031274127
-
-
Nakagawa, T.; Soga, M. Jpn. J. Appl. Phys., Part 1 1997, 36, 6915.
-
(1997)
Jpn. J. Appl. Phys., Part 1
, vol.36
, pp. 6915
-
-
Nakagawa, T.1
Soga, M.2
-
13
-
-
0000976768
-
-
Schwartz, D. K.; Steinberg, S.; Israelachvilli, J.; Zasadzinski, J. A. N. Phys. Rev. Lett. 1992, 69, 3354.
-
(1992)
Phys. Rev. Lett.
, vol.69
, pp. 3354
-
-
Schwartz, D.K.1
Steinberg, S.2
Israelachvilli, J.3
Zasadzinski, J.A.N.4
-
15
-
-
0000622679
-
-
Valiant, T.; Brunner, H.; Mayer, U.; Hoffmann, H.; Leitner, T.; Resch, R.; Friedbacher, G. J. Phys. Chem. B 1998, 102, 7190.
-
(1998)
J. Phys. Chem. B
, vol.102
, pp. 7190
-
-
Valiant, T.1
Brunner, H.2
Mayer, U.3
Hoffmann, H.4
Leitner, T.5
Resch, R.6
Friedbacher, G.7
-
16
-
-
0033560579
-
-
Brunner, H.; Valiant, T.; Mayer, U.; Hoffmann, H. J. Colloid Interface Sci. 1999, 212, 545.
-
(1999)
J. Colloid Interface Sci.
, vol.212
, pp. 545
-
-
Brunner, H.1
Valiant, T.2
Mayer, U.3
Hoffmann, H.4
-
18
-
-
0000279136
-
-
Leitner, T.; Priedbacher, G.; Valiant, T.; Brunner, H.; Mayer, U.; Hoffmann, H. Mikrochim. Acta 2000, 133, 331.
-
(2000)
Mikrochim. Acta
, vol.133
, pp. 331
-
-
Leitner, T.1
Priedbacher, G.2
Valiant, T.3
Brunner, H.4
Mayer, U.5
Hoffmann, H.6
-
19
-
-
0026204930
-
-
Silberzan, P.; Léger, L.; Ausserré, D.; Benattar, J. J. Langmuir 1991, 7, 1647.
-
(1991)
Langmuir
, vol.7
, pp. 1647
-
-
Silberzan, P.1
Léger, L.2
Ausserré, D.3
Benattar, J.J.4
-
20
-
-
3042540669
-
-
Glaser, A.; Foisner, J.; Hoffmann, H.; Friedbacher, G. Langmuir 2004, 20, 5599.
-
(2004)
Langmuir
, vol.20
, pp. 5599
-
-
Glaser, A.1
Foisner, J.2
Hoffmann, H.3
Friedbacher, G.4
-
21
-
-
0344241128
-
-
Brunner, H.; Valiant, T.; Mayer, U.; Hoffmann, H.; Basnar, B.; Vallant, M.; Friedbacher, G. Langmuir 1999, 15, 1899.
-
(1999)
Langmuir
, vol.15
, pp. 1899
-
-
Brunner, H.1
Valiant, T.2
Mayer, U.3
Hoffmann, H.4
Basnar, B.5
Vallant, M.6
Friedbacher, G.7
-
24
-
-
0028374315
-
-
Nakagawa, T.; Ogawa, K.; Kurumizawa, T. Langmuir 1994, 10, 525.
-
(1994)
Langmuir
, vol.10
, pp. 525
-
-
Nakagawa, T.1
Ogawa, K.2
Kurumizawa, T.3
-
25
-
-
1842627563
-
-
Foisner, J.; Glaser, A.; Leitner, T.; Hoffmann, H.; Friedbacher, G. Langmuir 2004, 20, 2701.
-
(2004)
Langmuir
, vol.20
, pp. 2701
-
-
Foisner, J.1
Glaser, A.2
Leitner, T.3
Hoffmann, H.4
Friedbacher, G.5
-
26
-
-
33751158455
-
-
Parikh, A. N.; Allara, D. L.; Azuz, I. B.; Rondelez, F. J. Phys. Chem. 1994, 98, 7577.
-
(1994)
J. Phys. Chem.
, vol.98
, pp. 7577
-
-
Parikh, A.N.1
Allara, D.L.2
Azuz, I.B.3
Rondelez, F.4
-
27
-
-
33751158356
-
-
Brzoska, J. B.; Azouz, I. B.; Rondelez, F. Langmuir 1994, 10, 4367.
-
(1994)
Langmuir
, vol.10
, pp. 4367
-
-
Brzoska, J.B.1
Azouz, I.B.2
Rondelez, F.3
-
28
-
-
0034513841
-
-
Iimura, K.J.; Nakajima, Y.; Kato, T. Thin Solid Films 2000, 379, 230.
-
(2000)
Thin Solid Films
, vol.379
, pp. 230
-
-
Iimura, K.J.1
Nakajima, Y.2
Kato, T.3
-
29
-
-
21044451148
-
-
Glaser, A.; Foisner, J.; Friedbacher, G.; Hoffmann, H. Anal. Bioanal. Chem. 2004, 379, 653.
-
(2004)
Anal. Bioanal. Chem.
, vol.379
, pp. 653
-
-
Glaser, A.1
Foisner, J.2
Friedbacher, G.3
Hoffmann, H.4
-
30
-
-
22444435009
-
-
Diploma Thesis, Vienna University of Technology, Vienna
-
Müllner, C. Diploma Thesis, Vienna University of Technology, Vienna, 2003.
-
(2003)
-
-
Müllner, C.1
-
32
-
-
0001588706
-
-
Bierbaum, K.; Grunze, M.; Baski, A. A.; Chi, L. F.; Schrepp, W.; Fuchs, H. Langmuir 1995, 11, 2143.
-
(1995)
Langmuir
, vol.11
, pp. 2143
-
-
Bierbaum, K.1
Grunze, M.2
Baski, A.A.3
Chi, L.F.4
Schrepp, W.5
Fuchs, H.6
-
33
-
-
22444451253
-
-
note
-
Theoretically, the height of an ODS monolayer with molecules attached perpendicularly to a substrate surface is 2.6 nm. The lower value found in the AFM images is due to height artifacts caused by different force interactions between the AFM tip and chemically different substrate termination. Further comments on the interpretation of the height values observed in Figure 2 can be found in the text.
-
-
-
-
34
-
-
0024701981
-
-
Wasserman, S. R.; Tao, Y. T.; Whitesides, G. M. Langmuir 1989, 5, 1074.
-
(1989)
Langmuir
, vol.5
, pp. 1074
-
-
Wasserman, S.R.1
Tao, Y.T.2
Whitesides, G.M.3
-
39
-
-
0000423022
-
-
Sung, M. M.; Carraro, C.; Yauw, O. W.; Kim, Y.; Maboudian, R. J. Phys. Chem. B 2000, 104, 1556.
-
(2000)
J. Phys. Chem. B
, vol.104
, pp. 1556
-
-
Sung, M.M.1
Carraro, C.2
Yauw, O.W.3
Kim, Y.4
Maboudian, R.5
-
40
-
-
11644250911
-
-
Carraro, C.; Yauw, O. W.; Sung, M. M.; Maboudian, R. J. Phys. Chem. B 1998, 102, 4441.
-
(1998)
J. Phys. Chem. B
, vol.102
, pp. 4441
-
-
Carraro, C.1
Yauw, O.W.2
Sung, M.M.3
Maboudian, R.4
-
42
-
-
0036828737
-
-
Ducey, M. W., Jr.; Orendorff, C. J.; Pemberton, J. E.; Sander, L. C. Anal. Chem. 2002, 74, 5585.
-
(2002)
Anal. Chem.
, vol.74
, pp. 5585
-
-
Ducey Jr., M.W.1
Orendorff, C.J.2
Pemberton, J.E.3
Sander, L.C.4
|