Formation of ultrathin films at the solid-liquid interface studied by in situ ellipsometry

Journal of Colloid and Interface Science

Volumn 212, Issue 2, 1999, Pages 545-552

  Brunner, Helmut ^a   Vallant, Thomas ^a   Mayer, Ulrich ^a   Hoffmann, Helmuth ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

In situ ellipsometry; Monolayer growth; Refractive index; Self assembled monolayers

Indexed keywords

ADSORPTION; ELLIPSOMETRY; FILM GROWTH; GOLD; MONOLAYERS; ORGANIC SOLVENTS; PHASE INTERFACES; REACTION KINETICS; REFRACTIVE INDEX; SILICON; SILICON COMPOUNDS; ULTRATHIN FILMS;

ALKYLSILOXANES; SELF-ASSEMBLED MONOLAYERS;

OPTICAL FILMS;

BROMOFORM; CARBON TETRACHLORIDE; CHLOROBENZENE; CYCLOHEXANE; GOLD; HEXANE; HYDROCARBON; PERFLEXANE; SILICON; SILOXANE; TOLUENE; UNCLASSIFIED DRUG;

ADSORPTION; ARTICLE; CHEMICAL COMPOSITION; ELLIPSOMETRY; FILM; ORGANIC CHEMISTRY; PHASE SEPARATION; PRIORITY JOURNAL; REFRACTION INDEX; SURFACE PROPERTY;

EID: 0033560579     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1006/jcis.1998.6062     Document Type: Article

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