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Volumn 20, Issue 7, 2004, Pages 2701-2706

Effects of surface hydrophobization on the growth of self-assembled monolayers on silicon

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; GROWTH (MATERIALS); INFRARED SPECTROSCOPY; MOLECULES; MONOLAYERS; SELF ASSEMBLY; SILICON;

EID: 1842627563     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la036261e     Document Type: Article
Times cited : (22)

References (30)
  • 23
    • 1842759181 scopus 로고    scopus 로고
    • note
    • The value of 80% corresponds to a layer thickness of 2.1 nm which is obtained by subtracting 0.2 nm (maximum measured thickness for the sole TMCS layer) from the total measured thickness of 2.3 nm.
  • 29
    • 0001468743 scopus 로고    scopus 로고
    • Rye, R. R. Langmuir 1997, 13, 2588.
    • (1997) Langmuir , vol.13 , pp. 2588
    • Rye, R.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.