Refractive index measurements of films with biaxial symmetry. 2. Determination of film thickness and refractive indices using polarized transmission spectra in the transparent wavelength range

Journal of Physical Chemistry B

Volumn 109, Issue 26, 2005, Pages 12819-12825

  Diao, Jie ^a   Hess, Dennis W ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIAXIAL SYMMETRY; OPTICAL ANISOTROPY; TRANSMISSION SPECTRA; WAVELENGTH RANGE;

ANISOTROPY; ELLIPSOMETRY; FILM GROWTH; LIGHT POLARIZATION; LIGHT SOURCES; POLYMERS; REFRACTIVE INDEX; THICKNESS MEASUREMENT;

PLASTIC FILMS;

EID: 22344436094     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0462761     Document Type: Article

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