An interference method for the determination of thin film anisotropy

Thin Solid Films

Volumn 279, Issue 1-2, 1996, Pages 119-123

  Surdutovich, G I ^a,b,c   Kolenda, J ^a   Fragalli, J F ^a   Misoguti, L ^a   Vitlina, R ^a,b,c   Baranauskas, V ^c  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

^b INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

^c UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

Anisotropy; Multilayers

Indexed keywords

ANISOTROPY; CALCULATIONS; MULTILAYERS; OPTICAL VARIABLES MEASUREMENT; OSCILLATIONS; POLARIZATION; REFLECTION; REFRACTIVE INDEX; SENSITIVITY ANALYSIS;

INTERFERENCE METHOD; LIGHT BEAMS; POLARIZED LIGHT; REFLECTANCE INTERFERENCE PATTERNS;

THIN FILMS;

EID: 0030171125     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)08165-8     Document Type: Article

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