Variable incidence angle method combined with Pluta polarizing interference microscope for refractive index and thickness measurement of single-medium fibres

Measurement Science and Technology

Volumn 14, Issue 10, 2003, Pages 1753-1759

  Sadik, A M ^a   Ramadan, W A ^a   Litwin, D ^b  

^a MANSOURA UNIVERSITY   (Egypt)

^b INSTITUTE OF APPLIED OPTICS   (Poland)

Author keywords

Computer aided; Fringe deflection; Optical path difference; Polarizing interference microscope; Refractive index; Single medium fibres; Thickness; Variable incidence angle

Indexed keywords

ANISOTROPY; LIGHT INTERFERENCE; LIGHT POLARIZATION; REFRACTIVE INDEX; THICKNESS MEASUREMENT;

FRINGE DEFLECTIONS;

SINGLE MODE FIBERS;

MEASUREMENT METHOD;

BIREFRINGENCE; FIBER PROPERTY; MEASURING SYSTEM; REFLECTIVE PROPERTY; THICKNESS;

EID: 0242338348     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/14/10/303     Document Type: Article

References (17)

1. Den Engelsen D 1971 Ellipsometry of anisotropic films J. Opt. Soc. Am. 61 1460-6
2. Aleksandrov S A and Chernyh I V 1992 Interferometer for measurements of absolute refractive index and thickness SPIE Proc. 1756 221-6
3. Betzler K, Grone A and Voigt P 1998 Interferometric measurement of refractive indices Rev. Sci. Instrum. 59 652-3
4. Williamson R 1991 Whenever two beams interfere, one fringe equals one wave in the plane of interference, always SPIE Proc. 1527 252-7
5. Goodman A M 1978 Optical interference method for the approximate determination of refractive index and thickness of a transparent layer J. Appl. Opt. 17 2779-87
6. Harrick N J 1971 Determination of refractive index and film thickness from interference fringes J. Appl. Opt. 10 2344-9
7. Carreno F and Bernabeu E 1995 Statistical algorithm to obtain refractive index and thickness from spectrophotometer interference patterns SPIE Proc. 2208 77-87
8. Filippov V V and Kutavichus V P 2001 Optical constants and film thickness calculation based on the ratio of envelopes of the reflectance spectrum SPIE Proc. 4517 87-94
9. Pluta M 1971 A double refracting interference microscope with continuously variable amount and direction of wavefront shear Opt. Acta 18 661-75
10. Pluta M 1993 Advanced Light Microscopy vol 3 (Amsterdam: Elsevier) pp 301-4
11. Barakat N and Hamza A A 1990 Interferometry of Fibrous Materials (Bristol: Hilger) pp 33-45
12. Yariv A and Yeh P 1984 Electromagnetic Propagation in Anisotropic Media (New York: Wiley) ch 4
13. Trolinge J D, Chipman R A and Wilson D K 1991 Polarization ray tracing in birefringent media J. Opt. Eng. 30 461-5
14. Sadik A M 2000 Modified interferometric method for refractive index profile measurement of multi-elliptical core optical fibres SPIE Proc. 4517 275-87
15. Sadik A M 2003 General formula for optical characterization of multi-elliptical core optical fibres with microscopic interferometry Int. J. Polym. Mater. 52 (9) at press
16. Pluta M 1993 Advanced Light Microscopy vol 3 (Amsterdam: Elsevier) p 393, 434
17. Barakat N and Hamza A A 1990 Interferometry of Fibrous Materials (Bristol: Hilger) p 40