VUV and IR spectroellipsometric studies of polymer surfaces

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 208, Issue 1-4, 2003, Pages 35-39

  Woollam, John A ^a,b   Bungay, Corey ^b   Hilfiker, James ^b   Tiwald, Tom ^b  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^b J A WOOLLAM CO INC   (United States)

Author keywords

Depth profiles; Infrared spectroscopic ellipsometry; Optical anisotropy; Polymers; Vacuum ultraviolet; Visible

Indexed keywords

ANISOTROPY; ELECTROMAGNETIC DISPERSION; ELLIPSOMETRY; INFRARED SPECTROSCOPY; LIGHT ABSORPTION; MICROSTRUCTURE; SURFACE CHEMISTRY; ULTRAVIOLET RADIATION;

OPTICAL ANISOTROPY;

POLYMERS;

EID: 0038825335     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(03)00983-2     Document Type: Conference Paper

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