Refractive index measurements of films with biaxial symmetry. 1. Determination of complex refractive indices using polarized reflectance/ transmittance ratio

Journal of Physical Chemistry B

Volumn 109, Issue 26, 2005, Pages 12800-12818

  Diao, Jie ^a   Hess, Dennis W ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIAXIAL SYMMETRY; OPTICAL ANISOTROPY; POLARIZED REFLECTANCE; TRANSMITTANCE RATIO;

ANISOTROPY; COMPUTER SIMULATION; ERROR ANALYSIS; LIGHT POLARIZATION; LIGHT REFLECTION; MOLECULAR ORIENTATION; POLYIMIDES; REFRACTIVE INDEX;

THIN FILMS;

EID: 22344436229     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp046277t     Document Type: Article

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