SCOPUS 정보 검색 플랫폼

Volumn 80, Issue 1-4, 1998, Pages 183-186

Ellipsometric study of refractive index anisotropy in porous silicon

Author keywords

Ellipsometry; Optical anisotropy; Porous silicon

Indexed keywords

EID: 0002985872 PISSN: 00222313 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-2313(98)00093-3 Document Type: Article

Times cited : (19)

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