Controllable method for the preparation of metalized probes for efficient scanning near-field optical Raman microscopy

Applied Physics Letters

Volumn 86, Issue 26, 2005, Pages 1-3

  Wang, J J ^a,b   Saito, Y ^c   Batchelder, D N ^a   Kirkham, J ^a   Robinson, C ^a   Smith, D A ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

^b PEKING UNIVERSITY   (China)

^c INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; FUNCTIONS; IMPURITIES; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; OXIDES; QUANTUM THEORY;

DIFFUSIVE TRANSPORT; MIRROR REACTION; OPTICAL RAMAN MICROSCOPY; SPATIAL RESOLUTION;

MIRRORS;

EID: 22144483080     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1978983     Document Type: Article

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