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Volumn 97, Issue 12, 2005, Pages

Modification of work function of Ti by self-assembled monolayer molecules on Si O 2 p-Si

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PERMITTIVITY; DIPOLE MOMENTS; EQUIVALENT OXIDE THICKNESS (EOT); VALENCE-BAND-EDGE ENERGIES;

EID: 21644474787     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1939083     Document Type: Article
Times cited : (11)

References (34)
  • 13
    • 84856123140 scopus 로고    scopus 로고
    • Semiconductor Industry Association (SIA) roadmap (www.sematech.org).
  • 27
    • 0001954222 scopus 로고    scopus 로고
    • edited by D. G.Seiler, A. C.Diebold, W. M.Bullis, T. J.Shaffner, R.McDonald, and E. J.Walters, AIP Conf. Proc. No. AIP, Woodbury, NY
    • J. R. Hauser and K. Ahmed, in Characterization and Metrology for ULSI Technology: 1998 International Conference, edited by, D. G. Seiler, A. C. Diebold, W. M. Bullis, T. J. Shaffner, R. McDonald, and, E. J. Walters, AIP Conf. Proc. No. 449 (AIP, Woodbury, NY, 1998), pp. 235-239.
    • (1998) Characterization and Metrology for ULSI Technology: 1998 International Conference , Issue.449 , pp. 235-239
    • Hauser, J.R.1    Ahmed, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.