High-resolution X-ray diffraction studies of molecular beam epitaxy-grown HgCdTe heterostructures and CdZnTe substrates

Journal of Electronic Materials

Volumn 34, Issue 6, 2005, Pages 795-803

  Sewell, R H ^a   Musca, C A ^a   Dell, J M ^a   Faraone, L ^a   Usher, B F ^b   Dieing, T ^b  

^a UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

^b LA TROBE UNIVERSITY   (Australia)

Author keywords

HgCdTe; Molecular beam epitaxy (MBE); Reciprocal space maps (RSMs); X ray diffraction

Indexed keywords

ANNEALING; ELASTICITY; FILM GROWTH; INFRARED DETECTORS; LATTICE CONSTANTS; MERCURY COMPOUNDS; MOLECULAR BEAM EPITAXY; NONDESTRUCTIVE EXAMINATION; STOICHIOMETRY; X RAY DIFFRACTION ANALYSIS;

ANISOTROPIC ELASTICITY; HGCDTE HETEROSTRUCTURES; LATTICE MISMATCH; RECIPROCAL SPACE MAPS (RSM);

HETEROJUNCTIONS;

EID: 21644458903     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-005-0023-7     Document Type: Conference Paper

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