Accurate determination of the lattice constant of molecular beam epitaxial CdHgTe

Journal of Crystal Growth

Volumn 222, Issue 4, 2001, Pages 719-725

  Skauli, T ^a   Colin, T ^a  

^a NORWEGIAN DEFENCE RESEARCH ESTABLISHMENT FFI   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; DEFORMATION; LATTICE CONSTANTS; MOLECULAR BEAM EPITAXY; SEMICONDUCTOR GROWTH; STOICHIOMETRY; STRAIN; X RAY DIFFRACTION ANALYSIS;

BOND METHOD; CADMIUM MERCURY TELLURIDE; LATTICE MISMATCH; VEGARD LAW;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0035251158     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)01005-8     Document Type: Article

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