Determination of individual layer composition and thickness in multilayer HgCdTe structures

Journal of Electronic Materials

Volumn 33, Issue 6, 2004, Pages 761-766

  Daraselia, M ^a   Carmody, M ^a   Zandian, M ^a   Arias, J M ^a  

^a ROCKWELL SCIENTIFIC COMPANY   (United States)

Author keywords

Dielectric function; Fourier transform infrared (FTIR); Multilayer structure model; Reflection; Refractive index dispersion; Transmission

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; ELLIPSOMETRY; ENERGY GAP; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MERCURY COMPOUNDS; MOLECULAR BEAM EPITAXY; OPTICAL CORRELATION; OPTICAL MICROSCOPY; PHOTODIODES;

BANDGAP; DIELECTRIC FUNCTIONS; MULTILAYERS STRUCTURE MODEL; REFRACTIVE INDEX DISPERSION;

OPTICAL MULTILAYERS;

EID: 3042747294     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-004-0079-9     Document Type: Conference Paper

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