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Journal of Electronic Materials

Volumn 27, Issue 6, 1998, Pages 615-623

Investigation of the cross-hatch pattern and localized defects in epitaxial HgCdTe

(7) Rhiger, David R a Peterson, Jeffrey M a Emerson, Robert M a Gordon, Eli E a Sen, Sanghamitra a Chen, Yue b Dudley, Michael b

a Santa Barbara Research Center (United States)

b STONY BROOK UNIVERSITY (United States)

Author keywords

Cross hatch; Defects; Failure analysis; HgCdTe; Liquid phase epitaxy (LPE); Misfit dislocations; Molecular beam epitaxy (MBE)

Indexed keywords

EID: 0042484090 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-998-0025-3 Document Type: Article

Times cited : (18)

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