Ion irradiation induced surface modification studies of polymers using SPM

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 236, Issue 1-4, 2005, Pages 186-194

  Tripathi, A ^a   Kumar, Amit ^a   Singh, F ^a   Kabiraj, D ^a   Avasthi, D K ^a   Pivin, J C ^b  

^a INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^b CNRS   (France)

Author keywords

Fullerene; HOPG; Polymers; SPM; Swift heavy ions

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; GELS; GRAPHITE; HEAVY IONS; ION BEAMS; IRRADIATION; POLYMERS; SCANNING TUNNELING MICROSCOPY;

HOPG; ION TRACKS; SCANNING PROBE MICROSCOPY (SPM); SWIFT HEAVY IONS;

SURFACE TREATMENT;

EID: 21644438237     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.04.059     Document Type: Conference Paper

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