Etched heavy ion tracks in polycarbonate as template for copper nanowires

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 185, Issue 1-4, 2001, Pages 192-197

  Toimil Molares, M E ^a   Brotz J ^b   Buschmann, V ^b   Dobrev, D ^a   Neumann, R ^a   Scholz, R ^c   Schuchert, I U ^a   Trautmann, C ^a   Vetter, J ^a  

^a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^c MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; COMPOSITION EFFECTS; COPPER; ELECTROCHEMISTRY; ETCHING; HEAVY IONS; ION BOMBARDMENT; METALLIC FILMS; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; THERMAL EFFECTS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; WIRE; X RAY DIFFRACTION ANALYSIS;

NANOWIRES;

POLYCARBONATES;

EID: 0035578062     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00755-8     Document Type: Article

References (24)