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Volumn 147, Issue 1-4, 1999, Pages 142-147
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AFM and STM investigation of carbon nanotubes produced by high energy ion irradiation of graphite
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Author keywords
Atomic force microscopy; Carbon nanotubes; Focused ion beam; Ion irradiation; Scanning tunneling microscopy; Vibrating carbon nanotube
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CARBON;
GRAPHITE;
HEAVY IONS;
HIGH ENERGY PHYSICS;
ION BEAMS;
KRYPTON;
NANOTUBES;
SCANNING TUNNELING MICROSCOPY;
SPUTTERING;
XENON;
FOCUSED ION BEAM;
HIGH ENERGY ION IRRADIATION;
ION BOMBARDMENT;
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EID: 0032741312
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(98)00565-5 Document Type: Article |
Times cited : (17)
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References (14)
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