Surface tracks by MeV C60 impacts on mica and PMMA

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 143, Issue 4, 1998, Pages 503-512

  Dobeli M ^a   Ames, F ^a   Musil, C R ^b   Scandella, L ^b   Suter, M ^a   Synal, H A ^a  

^a ETH ZURICH   (Switzerland)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Atomic force microscopy; Cluster ions; Fullerene; Particle tracks

Indexed keywords

ATOMIC FORCE MICROSCOPY; FULLERENES; GERMANIUM; IODINE; IONS; MICA; POLYMETHYL METHACRYLATES; RADIATION EFFECTS; SURFACES;

CLUSTER ION; PARTICLE TRACK;

ION BOMBARDMENT;

EID: 0038188029     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00511-4     Document Type: Article

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